This is an archive copy of the Crystallography World Wide component of the IUCr web site dating from 2008. For current content please visit the NEWS, PEOPLE and RESOURCES sections of https://www.iucr.org.

Crystallography Online

Dr. M. Ermrich

X- Ray Diffraction

Qualitative and quantitative phase analysis
Cristallinity, crystallite size / strain
Stress and texture determination
Investigation of thin layers
High temperature measurements

Consultation

Optimization of X-ray methods, devices and additional tools
Special problems / measurements of comparison
in preparation for buying an X- ray diffractometer

Seminars / lectures

X- Ray diffraction

Devices, measurement optimization, sample preparation....

Equipment

theta/theta- Diffractometer

Thin film attachment
½ Eulerian cradle
High temperature attachment (1600°C)

theta/2theta- Diffractometer

Routine analysis
Sample changer

Transmission diffractometer

Thin foils, small sample amounts, capillary technique
High temperature attachment (900°C)

Westring 80
(Postfach 4108)
D - 64354 Reinheim near Darmstadt
Germany

Phone/Fax: 49 (6162) 837 56